104th ARFTG Microwave Measurement Symposium

Advanced Nonlinear and Linear Microwave Measurements

  • San Juan, Puerto Rico | Sheraton Puerto Rico

  • January 19-22, 2025

Co-located with
Radio & Wireless Week RWW-2025

Conference news
  • Large signal measurements including modeling and linearization of nonlinear devices, circuits, and systems
  • VNA/NVNA/VSA/Scope measurement & calibration to support 5G, 6G and Future-G systems
  • Millimeter-wave antenna and OTA testing
  • THz/mm-wave measurements, including both CW and  modulated signals
  • Measurement-based machine-learning methods and AI applications
  • Innovative measurements in quantum technology
  • RF/digital mixed-signal measurement and calibration
  • On-wafer calibration and measurement techniques
  • Microwave measurements for bio-medical applications
  • Characterization of material properties
  • Other recent developments in metrology incl. measurement uncertainty
ARFTG-104 Deadlines

  • Abstract summary due: September 9. Extended to September 23, 2024

  • Paper acceptance and classification: October 7. Extended to October 11, 2024

  • Publication ready paper due: November 4, 2024

Conference Chairs

general chair

Patrick Roblin

The Ohio State University, USA

co-chair

Andrej Rumiantsev

MPI Corporation, Taiwan

Technical Program Chairs

TPC Chair

J. Apolinar Reynoso-Hernández

CICESE, Mexico

TPC CO-chair

Mauro Marchetti

Maury Microwave, USA

ARFTG-104 Keynote Speaker
AMCAD Engineering

Tony Gasseling

Advancements in Transistor and Circuit Modeling for Next-Generation RF Circuit Design Techniques

RWW/ARFTG Plenary Speaker
Modelithics, Inc.

Larry Dunleavy

The convergence of advanced models and measurements
for virtual prototyping success

Invited speakers
University of Colorado Boulder, USA

 Zoya Popovic

Characterization of GaN Transistors and Efficient PAs with Modulated Signals

Michigan State University, USA

Nicholas C. Miller

Impact of Uncertainty and Non-Idealities in On-Wafer Multiline TRL Calibration on Broadband GaN HEMT Modeling

Keysight Technologies, USA

Jean Pierre Teyssier

Trends in DUT Characterizations with Wideband Test Signals

Cardiff University, UK

Roberto Quaglia

Paving the Way to Accurate mm-Wave NVNA Measurements

Conference materials

ARFTG-104 Conference

Conference Program | PDF

NIST-ARFTG Short Course

Short Course Program | PDF

ARFTG Workshop

Workshop Program | PDF

Call for Papers

Topics, deadlines and instructions for authors | PDF

Event schedule