105th ARFTG Microwave Measurement Conference

Challenges in Microwave Measurements under Cryogenic Conditions

  • Moscone Center, San Francisco, CA, USA

  • June 20, 2025

Co-located with
International Microwave Symposium IMS-2025
15-20 June 2025

Conference news
ARFTG-105 Keynote Speaker
NIST, USA

Samuel P. Benz

Superconductive Electronics for Quantum-based Signal Synthesis and Measurements

Friday, June 21 | 8:00 - 8:40

Conference materials

Technical Program

Detailed sessions schedule | PDF

Activity Agenda

Conference Agenda | PDF

Call for Papers

Topics, deadlines and instructions for authors | PDF

 

  • Measurement & calibration to support quantum computing circuits/systems
  • Noise measurement under cryogenic conditions
  • Free space calibration and measurements in confined cryogenic environments
  • Calibrations and measurements on devices and systems in space
  • Other innovative measurements in quantum technologies

 

  • RF/digital mixed-signal measurement and calibration
  • On-wafer calibration and measurements
  • Characterization of material properties
  • Other recent developments in metrology incl. measurement uncertainty

Conference Chairs

General Chair

Dennis Lewis

Boeing, USA

co-chair

Dominique Schreurs

KU Leuven, Belgium

Technical Program Chairs

TPC Chair

Chong Li

University of Glasgow, UK

TPC CO-chair

Apolinar J. Reynoso-Hernández

CICESE, Mexico

ARFTG-105 Deadlines

  • Abstract summary due: March 10, 2025

  • Paper acceptance and classification: March 31, 2025

  • Publication ready paper due: April 18, 2024

Event schedule