106th ARFTG Microwave Measurement Symposium

Microwave Measurements for Communication and Sensing Technologies

  • Hollywood, CA, USA | Loews Hollywood Hotel, Los Angeles

  • January 18-21, 2026

Co-located with
Radio & Wireless Week RWW-2026

Conference news
  • Calibration and measurement techniques for future communication systems incl. 6G
  • Measurement techniques for sensing applications (e.g. space and autonomous systems)
  • Cryogenic measurements for quantum and radio astronomy applications
  • Millimeter-wave antennas, OTA testing, and RIS testing
  • Microwave measurement techniques applied to AI and other emerging technologies

 

  • RF/digital mixed-signal measurement and calibration
  • On-wafer calibration and measurements
  • Characterization of material properties
  • Large signal measurements including linearization of devices, circuits, and systems
  • Microwave measurements for biomedical applications
  • Other recent developments in metrology incl. measurement uncertainty
Conference materials

NIST/ARFTG Short Course

Full Short Course Program | PDF

Abbreviated Program

ARFTG-106 Program | PDF

Activity Agenda

Symposium Agenda | PDF

Call for Papers

Topics, deadlines and instructions for authors | PDF

ExCom Election

Candidates’ Biographies | PDF

Conference Chairs

general chair

Chong Li

University of Glasgow, UK

co-chair

Patrick Roblin

The Ohio State University, USA

Technical Program Chairs

TPC Chair

Xiaobang Shang

Nathional Physical Laboratory, UK

TPC CO-chair

Dominique Schreurs

KU Leuven, Belgium

ARFTG-106 Keynote Speaker
University of Oulu

Marko E. Leinonen

6G: Unifying Telecommunication, Radio Imaging and Sensing?

RWW/ARFTG Plenary Speaker
Keysight Technologies

Joel Dunsmore

VNA Everywhere, VNA Everything: The History and Evolution of the Modern Network Analyzer, and why SATCOM and 6G Needs It

Invited speaker
Quantum Motion, UK

Grayson Noah

Cryo-CMOS RF Device Characterization and Integration for Scalable Quantum Computing

Session E:
Cryogenic and Non-linear Measurements

Tue| Jan 20 | 15:40 - 16:05

Event schedule