We are pleased to invite you to the 105th ARFTG Microwave Measurement Conference, taking place on June 20–21, 2025, at the Moscone Center in San Francisco, USA.

This year’s theme, “Challenges in Microwave Measurements under Cryogenic Conditions,” highlights advances and ongoing challenges in microwave and RF measurement technologies, particularly in cryogenic environments critical for quantum applications and beyond.

The technical program will feature:

• A keynote presentation by S. P. Benz (NIST) on superconductive electronics for quantum-based signal synthesis and measurements
• Sessions on cryogenic measurements, noise and disturbances, nonlinear devices, and calibration techniques
• A Student Paper Competition showcasing emerging research from leading academic institutions
• An Interactive Forum with posters covering a wide range of innovative topics in microwave measurements

The conference also includes an awards luncheon celebrating outstanding contributions to our field.

Join us for a full day of presentations, discussions, and networking with experts from industry, academia, and government institutions.

We look forward to welcoming you to San Francisco!

Register to the ARFTG-105 Microwave Measurement Conference through the IMS-2025 registration system.