Prof. J. Apolinar Reynoso-Hernández (AM’92-M’2003) received his Electronics and Telecommunications Engineering degree, M. Sc. degree in Solid State Physics and Ph. D. degree in Electronics, from ESIME-IPN, Mexico, CINVESTAV- IPN, Mexico and Université Paul Sabatier-LAAS du CNRS, Toulouse, France, in 1980, 1985 and 1989 respectively. His doctoral thesis was on Low frequency noise in MESFET and HEMTs. Since 1990 he has been a researcher at the Electronics and Telecommunications Department of CICESE in Ensenada, B. C., Mexico. His areas of specialized research interest include, high frequency on-wafer measurements, high frequency device modeling, linear and non-linear device modeling. Among the most outstanding contributions of Prof. Reynoso Hernández and his research group to the theory of VNA calibration techniques are the development of the LZZ calibration technique and the generalized theory of the TRM calibration technique. He has contributed more 15 publications at the ARFTG and has leaded CICESE’s Microwave group to obtain the best interactive forum paper award five times. Since 2013 he has served as TPC of ARFTG and has organized workshops for ARFTG and MTT.