The election of new ARFTG Executive Committee (ExCom) members will take place during the ARFTG Business Meeting at the upcoming ARFTG-106 Microwave Measurement Conference on Monday, January 19th, 2026.

This year’s slate of candidates represents a broad cross-section of the global microwave measurement community, spanning national metrology institutes, industry, and academia, and covering expertise from VNA technology and on-wafer metrology to nonlinear and high-frequency device characterization.

All ARFTG members are encouraged to attend the Business Meeting, learn more about the candidates, and participate in shaping the future direction of ARFTG through their vote.

Candidate biographies and statements are available in the official election document.

Patrick Roblin
ARFTG Vice-President,
Strategic Planning & Nominations