Joe Gering has a BS from the University of Louisville and an MS and Ph.D. from the University of Illinois at Urbana-Champaign. He is currently the Director of Modeling and Characterization with Qorvo. His group covers modeling (large-signal equivalent-circuit and behavioral), technology characterization and benchmarking, simulation methods, and a device metrology lab, all of which support Qorvo’s internal GaAs and external GaAs and silicon processes. His technical interests include modeling and characterization of semiconductor devices and related measurement techniques with an emphasis on large-signal characterization. Prior to joining RFMD (which merged with TriQuint to form Qorvo), he was with Skyworks Solutions in the Modeling Group and before that Raytheon Company in several device development roles. He has over 35 years of experience with device development, modeling, and characterization and has worked with 94 GHz IMPATT diodes and 900 MHz HBTs and some things in between. Joe has been a member of ARFTG for 15 years and has served on the ARFTG Executive Committee for the past 10 years. He is the current ARFTG President and has held Sponsorship, Exhibits, and Secretary roles, previously. In the past, he was also a co-organizer of the NVNA Users’ Forum. Joe has authored or been a co-author on several papers dealing with large-signal device measurement techniques and their relative accuracy.