The ARFTG-104th NIST/ARFTG Short Course, held on January 19-20, 2025, in San Juan, Puerto Rico, is designed for engineers, students, and professionals aiming to advance their skills in precision microwave measurements. This one-and-half-day course offers an in-depth exploration of essential topics in RF and microwave metrology, with sessions covering measurement fundamentals, nonlinear measurements, and advanced on-wafer applications at mm-wave frequencies and beyond.

The program includes presentations from industry, academic and metrology experts who provide practical insights into topics like vector nonlinear microwave measurements, load-pull techniques, on-wafer, and cryogenic RF measurements. Attendees will gain hands-on knowledge in areas such as traceability in power measurements, calibration techniques, and challenges associated with on-wafer measurements above 100 GHz.

This comprehensive curriculum is an excellent opportunity for those in metrology, communications, and semiconductor industries to strengthen their understanding of cutting-edge measurement technologies.