February 16, 2025|

Reflections on the 20th On-Wafer Users Forum in San Juan & Looking Ahead to IMS-2025/ARFTG-105

The 20th On-Wafer Forum took place during ARFTG-104 in San Juan, Puerto Rico, marking a special milestone with an anniversary celebration. The event brought together 16 experts from industry, metrology, and academia, fostering lively discussions and valuable knowledge exchange.

The forum focused on critical technical challenges in on-wafer measurements, featuring insightful presentations from:

  • Kamel Haddadi (University of Lille)
  • Rob Jones (Colorado School of Mines/NIST)

Among the hot topics discussed:

  • The use of AI and nanorobotics to enhance probe positioning accuracy
  • Strategies for reducing on-wafer characterization errors through advanced calibration kit designs spanning gigahertz to terahertz frequencies
  • Innovative approaches to minimizing coupling effects while optimizing probe placement—validated by measurement results extending to the THz range

These discussions provided new perspectives on overcoming measurement challenges and strengthened collaboration between researchers and industry professionals.

Join Us at the Next On-Wafer Forum!

Building on this momentum, we invite you to participate in the 21st On-Wafer Forum, taking place during IMS-2025/ARFTG-105 week in San Francisco. This forum is a unique opportunity to:

  • Share your latest research and technical challenges.
  • Engage with leading experts in RF, microwave, and terahertz metrology.
  • Shape the future of on-wafer measurement techniques.

More information on ARFTG Users’ Forums is available from the User Forum page.

See you in San Francisco!

Gia Ngoc Phung,
ARFTG ExCom
Users Forums Chair

Pictures: lylephotos.com, Atlanta, GA

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