Retrospective: ARFTG-103 Symposium
We proudly look back at the 103rd ARFTG Microwave Measurement Symposium “Advanced Measurement Techniques for Next-G Communication Systems”: following IMS-2024 roughly 100 attendees took part in joint IMS/ARFTG workshops and measurement sessions, NVNA and On-Wafer Measurement Users’ Forums, as well as in the main conference. The Symposium took place at the Walter E. Washington Convention Center in Washington, DC.
Friday, June 21st
ARFTG Microwave Measurement Conference
The 103rd ARFTG Microwave Measurement Conference began with introductions by ARFTG President, Rusty Myers, and Conference Chair Dominique Schreurs. On this occasion, about 100 people attended, between ARFTG-only and Superpass registrants.
The 103rd ARFTG Microwave Measurement Conference began with introductions by ARFTG President, Rusty Myers (left), and Conference Chair Dominique Schreurs (right). Photos: LylePhotos.com, Atlanta
The conference consisted of four oral sessions and an interactive forum with 29 papers as well as a keynote talk “Approaches to Industrialize and Characterize Near-THz Communication Systems” by Yves Baeyens (Nokia / Bell-Labs).
Keynote talk
Yves Baeyens (Nokia / Bell-Labs) on “Approaches to Industrialize and Characterize Near-THz Communication Systems”
Photo: Andrej Rumiantsev
Sun, June 16th – Thu, June 20th
Joint Workshops & Technical Sessions
ARFTG co-sponsored four workshops and two technical sessions at IMS-2024.
workshop lectures
- June 16 – WSA: Addressing Microwave Measurement and Engineering Challenges in Realising Practical Quantum Computers
- June 17 – WMH: Efficient and Linear Power Amplifier Design for Wideband Signals: Still an Art?
- June 17 – WMG: New Design and Testing Approached for Optimizing Efficiency and Thermal Performance in Phased Arrays and mm-Wave Front-Ends
- June 17 – WMF: On-Wafer mm-Wave Load-Pull for beyond 5G Microelectronics Characterization
IMS-2024 Technical Sessions
- June 20 – Th1G: Who Needs Contact? Developments in OTA Measurement
- June 20 – Th2G: Advancing Characterization at mm-Wave Frequencies
User Forums and Standard Working Group Meetings
The ARFTG Symposium hosted two users’ forums on the June 20th: the NVNA Users’ Forum and the On-Wafer Measurement Users’ Forum.
NVNA User Forum
The NVNA Users’ Forum was organized by Karun Rawat (Indian Institute of Technology Roorkee, India). About 26 participants attended with the following presentations: and
- Low-Frequency CW & Real-Time NVNA measurements – Miles Lindquist (The Ohio State University, USA)
- Optimum Driving Signals’ Extraction for Dual Input Load-Modulated – PAs Filipe M. Barradas, Luis C. Nunes, Jose C. Pedro (Instituto de Telecomunicações, DETI, Universidade de Aveiro, Portugal)
On-Wafer User Forum
The On-Wafer Users’ Forum was organized by Gia Ngoc Phung (PTB). About 20 participants attended with the following presentations and discussion:
- Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz – Xiaobang Shang (NPL, UK)
- “On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors – Dr. Tomasz Karpisz (NIST, USA)
Standards Meetings
Additionally, the ARFTG Symposium hosted the IEEE P1785, P2822, and P3136 Standards WG Meetings on June 19.
Friday, June 21st
Conference Awards Luncheon
Conference General co-Chairs Dominique Schreurs and Marco Spirito.
Photo: LylePhotos.com, Atlanta.
Conference Techical Program co-Chairs Mauro Marchetti and Dennis Lewis.
Photo: LylePhotos.com, Atlanta.
ARFTG President, Rusty Myers, presided over the conference awards ceremony, which took place during the awards luncheon. Certificates of appreciation were presented to the organizers of the 103rd Conference, namely Dominique Schreurs and Marco Spirito as Conference Co-Chairs and Mauro Marchetti and Dennis Lewis as Technical Program Co-Chairs.
The ARFTG-102 Best Oral Presentation award went to Mauro Marchetti, Gustavo Avolio, Nikolai Balovnev (Anteverta-mw B.V.) and Martino Lorenzini (Gallium Semiconductor) for their paper, “Double-Pulse Load-Pull for Trapping Characterization of GaN Transistors.” The ARFTG-102 Best Student Presentation award went to Ziad Hatab, Michael E. Gadringer, and Wolfgang Bösch (Graz University of Technology) for their paper, “Error-Box Calibration of Three-Sampler VNAs.” The ARFTG-103 Best Exhibitor was awarded to Keysight Technologies.
Roger Pollard Student Fellowship
This year, ARFTG Executive Committee selected two winners of the Roger Pollard Student Fellowship program from the submitted applications. Jin Wang (University of Cornell) received the Gold Level Award and Tianze Li (Cornell University) received the Silver Level Award of US$7500 and US$5000, respectively. The Award certificates were presented to winners during the ARFTG Awards Luncheon by ARFTG President Rusty Myers.
Winners of the ARFTG-103 Awards Competition
Traditionally, our conference attendees vote for the Best Paper and Best Student Paper, presented during the Conference. We are delighted to congratulate this year’s winners of the vote.
ARFTG-103 Impressions
Pictures: LylePhotos.com, Atlanta and Andrej Rumiantsev
