ARFTG Roger Pollard Student Fellowship Award in Microwave Measurements was presented to Xiaopeng Wang (Cornell University, Ithaca, NY, USA). ARFTG Student Fellowship program will support Xiaopeng Wang’s research in “Inverted Scanning Microwave Microscopy for Nanoelectronic Materials and Devices”.

Xiaopeng Wang (Graduate Student Member, IEEE) received the B.S. degree in information engineering from Xi’an Jiaotong University, Xi’an, China, in 2015, and the M.S. degree in electrical engineering from Lehigh University, Bethlehem, PA, USA, in 2017. He is currently pursuing the Ph.D. degree in electrical engineering at Cornell University, Ithaca, NY, USA.,His current research interests include scanning microwave microscopy, microwave measurement, characterization of GaN/AlN heterostructures, 3-D electromagnetic simulation using finite-element methods, and other microwave device characterization techniques.