This year’s program reflects the evolving landscape of microwave metrology, with strong contributions spanning traceability, automation, and emerging measurement challenges for next-generation systems. The conference opens with a keynote from NIST, setting the stage for discussions on the future of measurement science.

The program features work on uncertainty analysis and inter-laboratory comparisons extending to 220 GHz, highlighting continued progress in measurement reproducibility and standards development. Advances in intelligent measurement systems are also prominent, including autonomous on-wafer probing, nanorobotic probe alignment, and machine learning-assisted calibration techniques.

Sessions on over-the-air and nonlinear measurements address the growing demands of wideband and millimeter-wave applications, while dedicated contributions on on-wafer calibration and device characterization demonstrate ongoing innovation in measurement methodologies.

In addition to the oral sessions, the interactive forum showcases emerging research topics, including cryogenic measurements, advanced materials, and 5G/6G system characterization. A strong presence of student contributions underscores the continued vitality of the measurement community.

The finalized program offers both depth and breadth across the field, making it a key event for engineers and researchers working in microwave and millimeter-wave measurements.