ARFTG is pleased to announce two upcoming User Forums, designed to foster interactive discussion and community exchange on advanced RF and microwave measurement techniques.

These forums (free to attend) provide a valuable opportunity to engage with peers, share practical challenges, and explore emerging solutions in measurement science.

NVNA Users’ Forum

The NVNA Users’ Forum focuses on the latest developments in nonlinear device characterisation, waveform engineering, and large-signal measurements.

Date: Thursday, 11 June 2026, 3:00 pm – 4:15 pm
Location: Westin Boston Seaport Hotel, Commonwealth AB

Forum Programme

3:00 – 3:10 — Welcome
Patrick Roblin (The Ohio State University, USA)

3:10 – 3:30 — W-band Vector-Calibrated Active Load-Pull Measurements
Nick Miller (Michigan State University, USA)

3:30 – 3:40 — Discussion
Moderator: Patrick Roblin (The Ohio State University, USA)

3:40 – 4:00 — Advanced Time-Domain Techniques for Nonlinear Device Measurement
G. Barataud et al. (XLIM, France)

4:00 – 4:10 — Discussion
Moderator: Patrick Roblin (The Ohio State University, USA)

4:10 – 4:15 — Farewell

Forum 2: On-Wafer Users’ Forum

The On-Wafer Users’ Forum addresses key challenges in wafer-level RF/mm-wave measurements, including calibration, probing, and emerging high-frequency applications.

Date: Thursday, 11 June 2026, 4:15 pm – 6:00 pm
Location: Westin Boston Seaport Hotel, Commonwealth AB

Forum Programme

4:15 — Welcome
Gia Ngoc Phung (PTB, Germany)

4:15 – 4:35 — Rethinking the Math Behind Multiline TRL Calibration
Ziad Hatab (Keysight Technologies, USA)

4:35 – 4:50 — Discussion
Moderator: Gia Ngoc Phung (PTB, Germany)

4:50 – 5:10 — An Alternative Approach to Multiline TRL Calibrations
James Skinner (NPL, UK)

5:10 – 5:25 — Discussion
Moderator: Gia Ngoc Phung (PTB, Germany)

5:25 – 5:45 — Reappraisal of S-Parameter Basics in Light of 4-Port TRL De-embedding
Shuhei Amakawa (Hiroshima University, Japan)

5:45 – 6:00 — Discussion
Moderator: Gia Ngoc Phung (PTB, Germany)

6:00 — Farewell

Why Participate?

• Engage with leading experts in RF and microwave measurement
• Share challenges and practical solutions
• Learn about the latest advancements in instrumentation and calibration
• Help shape future ARFTG technical activities

Participation

These forums are highly interactive. Attendees are encouraged to contribute questions, share experiences, and actively participate in discussions.