On behalf of the organizing committee, it is my pleasure to welcome you to the 107th ARFTG Microwave Measurement Conference, held on June 12, 2026, in Boston, MA, as part of the IEEE MTT-S International Microwave Symposium (IMS) 2026 week.

This year’s theme, “Measuring the Future: High-Frequency Metrology for Intelligent, Connected, and Quantum Worlds“, reflects where our community stands today. As operating frequencies extend into the sub-THz range, bandwidths widen, data rates accelerate, and the complexity of devices and systems grows exponentially, the demand for accurate, traceable, and standardized measurement techniques has never been greater. Metrology is no longer a supporting discipline — it is a prerequisite for progress. ARFTG-107 brings together the measurement community to address precisely these challenges.

The technical program features four focused sessions spanning metrology and traceability, intelligent automation for microwave measurements, over-the-air and nonlinear measurements, and on-wafer measurements and calibration. The program opens with a keynote by Dr. Nathan D. Orloff of NIST, titled “The Evolution of Wafer-Level Metrology“, a timely contribution covering SI-traceability at the wafer level, new calibration standards, and the path toward wafer-level phase traceability. An Interactive Forum and two exhibit breaks provide dedicated opportunities for direct technical exchange with presenters and industry representatives.

A highlight of the conference day is the ARFTG-107 Awards Luncheon, where the 106th ARFTG Conference Awards will be formally presented, recognizing outstanding contributions in oral presentations, student papers, interactive forum presentations, and industry exhibition.

ARFTG’s presence at Microwave Week extends well beyond the conference day itself. During the week, ARFTG co-sponsors four workshops together with RFSA and RFTT:

• WSI on Sunday, June 7: A joint RFTT/ARFTG workshop on RF test and measurement fundamentals and techniques.
• WMK and WMM on Monday, June 8: Two joint workshops co-organized with RFSA and RFTT, addressing RF spectrum analysis and measurement system topics across the morning and afternoon sessions.
• WThA on Thursday, June 11: A joint RFSA/ARFTG workshop rounding out the week’s measurement-focused program.

The NVNA Users Forum and the On-Wafer Users Forum, both held on Thursday, provide focused venues for specialized technical exchange in nonlinear vector network analysis and wafer-level measurements respectively. IEEE Standards Working Group meetings, including P2822, P3136, P287.1, and P1785, convene during the week to advance standardization efforts in microwave measurements, waveguide interfaces, and related areas.

The quality of the ARFTG-107 program reflects the dedicated work of many. I would like to express my sincere appreciation to the Technical Program Co-Chairs, Gia Ngoc Phung (PTB) and Xiaobang Shang (NPL), to the members of the Technical Program Committee, and to all paper reviewers for their rigorous and thorough evaluation of submissions. I also thank my General Co-Chair, Dennis Lewis (Boeing), and the entire ARFTG Executive Committee for their sustained contributions to making this conference possible.

ARFTG is generously supported by its sponsors, whose commitment makes this community possible. We thank our Gold Sponsors — MPI Corporation, FormFactor, and Eravant — and our Silver Sponsors — Keysight Technologies, Anritsu, Qorvo, Copper Mountain Technologies, and Virginia Diodes — for their continued support. Sponsorship enables ARFTG to advance the awareness and practice of microwave measurement techniques across the engineering community, and critically, to support the next generation of measurement scientists through the ARFTG Student Sponsorship and Roger Pollard Award Fellowship programs. We encourage the community to engage with our sponsors and recognize the vital role they play in sustaining ARFTG’s mission.

ARFTG has always been defined by the strength of its community, the close collaboration between national metrology institutes, industry, and academia that drives the state of the art in microwave measurements forward. We are pleased to see that tradition continue strongly at ARFTG-107. I look forward to welcoming you in Boston.

Andrej Rumiantsev
General Chair, 107th ARFTG Microwave Measurement Conference
MPI Corporation.