107th ARFTG Microwave Measurement Conference

Measuring the Future: High-Frequency Metrology for Intelligent, Connected, and Quantum Worlds

  • The Westin Boston Seaport District, Boston, MA, USA

  • June 12, 2026

Co-located with
International Microwave Symposium IMS-2026
7-12 June 2026

Conference news

 

  • High-frequency metrology and traceability of electrical quantities
  • Calibration and measurement techniques for future communication systems and sensing applications
  • New measurement instrumentation
  • Cryogenic measurements for quantum and radio astronomy applications
  • Microwave measurement techniques applied to AI technologies
  • Non-linear measurements
  • Metrology for EO/OE interfaces and photonic integrated circuits

 

  • On-wafer calibration and measurements
  • Large signal measurements incl. linearization of devices, circuits, and systems
  • Characterization of material properties
  • RF/digital mixed-signal measurement and calibration
  • Millimeter-wave antennas, OTA testing, and RIS testing
  • Other recent developments in metrology incl. measurement uncertainty

Conference Chairs

General Chair

Andrej Rumiantsev

MPI Corporation, Taiwan

Co-Chair

Dennis Lewis

Boeing, USA

Technical Program Chairs

TPC Chair

Gia Ngoc Phung

Physikalisch-Technische Bundesanstalt (PTB), Germany

TPC Chair

Xiaobang Shang

Nathional Physical Laboratory, UK

ARFTG-107 Keynote Speaker
NIST

Dr. Nathan D. Orloff

The Evolution of Wafer-Level Metrology

Conference materials

Conference Book

Full Conference: Sessions,  Workshops, Users’ Forums’  | PDF

Abbreviated Program

Sessions, Presentations and Interactive Forum | PDF

Activity Agenda

Workshops, Forums, Standards and Sessions | PDF

Call for Papers

Topics, deadlines and instructions for authors | PDF

ARFTG-108 Deadlines

  • Abstract summary due: September 11, 2026

  • Paper acceptance and classification: October 9, 2026

  • Publication ready paper due: November 2, 2026

Event schedule